Stoichiometry and Thickness of Epitaxial SrTiO3 onSilicon (001): an Investigation of Physical, Optical andElectrical Properties

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Authors: Andries Boelen, Marina Baryshnikova, Anja Ulrich, Kamal Brahim, Joris Van de Vondel, Christian Haffner, Clement Merckling

Journal publisher: ArXiv

Published year: 2025