"Electron-beam-induced charging of an Al<mml:math xmlns:mml=""http://www.w3.org/1998/Math/MathML"" altimg=""si50.svg"" display=""inline"" id=""d1e260""><mml:msub><mml:mrow/><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:math>O3 nanotip studied using off-axis electron holography"

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Authors: Fengshan Zheng, Marco Beleggia, Vadim Migunov, Giulio Pozzi, Rafal E. Dunin-Borkowski

Journal title: Ultramicroscopy

Journal number: 241

Journal publisher: Elsevier BV

Published year: 2024

Published pages: 113593

DOI identifier: 10.1016/j.ultramic.2022.113593

ISSN: 0304-3991