Quantitative electric field mapping between electrically biased needles by scanning transmission electron microscopy and electron holography

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Authors: Jean Felix Dushimineza, Janghyun Jo, Rafal E. Dunin-Borkowski, Knut Müller-Caspary

Journal title: Ultramicroscopy

Journal number: 253

Journal publisher: Elsevier BV

Published year: 2024

Published pages: 113808

DOI identifier: 10.1016/j.ultramic.2023.113808

ISSN: 0304-3991