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Authors: Yun Luo, Ying Duan, Wenfeng Li, Pasquale Pace, Giancarlo Fortino
Journal title: IEEE Transactions on Industrial Informatics
Journal number: 14/8
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 3534-3546
DOI identifier: 10.1109/tii.2018.2824324
ISSN: 1551-3203