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Authors: Yun Luo, Ying Duan, Wenfeng Li, Pasquale Pace, Giancarlo Fortino
Journal title: IEEE Communications Magazine
Journal number: 56/2
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 68-75
DOI identifier: 10.1109/mcom.2018.1700618
ISSN: 0163-6804