Demographic Variability in Face Image Quality Measures

Summary

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Authors: Wassim Kabbani, Kiran Raja, Raghavendra Ramachandra, Christoph Busch

Journal title: 2024 International Conference of the Biometrics Special Interest Group (BIOSIG)

Journal publisher: IEEE

Published year: 2024

Published pages: 1-6

DOI identifier: 10.1109/biosig61931.2024.10786726