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Authors: Anton Alexeev, Genevieve Martin, Volker Hildenbrand
Journal title: 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
Journal publisher: IEEE
Published year: 2017
Published pages: 283-289
DOI identifier: 10.1109/SEMI-THERM.2017.7896942
ISBN:978-1-5386-1531-7
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