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Authors: Qi Tang, Elliott Worsey, Mukesh K. Kulsreshath, Yue Fan, Yingying Li, Simon Bleiker, Harold Chong, Frank Niklaus, Dinesh Pamunuwa
Journal title: IEEE Transactions on Electron Devices
Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published year: 2025
DOI identifier: 10.1109/TED.2025.3537945
ISSN: 0018-9383
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