RF Characterization of Ferroelectric MOS Capacitors

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Authors: Anton E. O. Persson, Stefan Andrić, Lars Fhager, Lars-Erik Wernersson

Journal title: IEEE Electron Device Letters

Journal number: 45

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2024

Published pages: 1653-1656

DOI identifier: 10.1109/led.2024.3428971

ISSN: 0741-3106