Cryogenic Ferroelectricity of HZO Capacitors on a III–V Semiconductor

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Authors: Mamidala Karthik Ram, Hannes Dahlberg, Lars-Erik Wernersson

Journal title: IEEE Electron Device Letters

Journal number: 45

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2024

Published pages: 1827-1830

DOI identifier: 10.1109/led.2024.3448378

ISSN: 0741-3106