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Authors: Kevin P. Nolan, Akshat Agarwal, Shenghui Lei, Eric Dalton
Journal title: 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
Journal publisher: IEEE
Published year: 2016
Published pages: 301-306
DOI identifier: 10.1109/ITHERM.2016.7517564
ISBN: 978-1-4673-8121-5