Bias Stress and Temperature Impact on InGaZnO TFTs and Circuits

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Authors: Jorge Martins, Pydi Bahubalindruni, Ana Rovisco, Asal Kiazadeh, Rodrigo Martins, Elvira Fortunato, Pedro Barquinha

Journal title: Materials

Journal number: 10/6

Journal publisher: MDPI Open Access Publishing

Published year: 2017

Published pages: 680

DOI identifier: 10.3390/ma10060680

ISSN: 1996-1944