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Authors: M. Duval, V. Guilarte, M. Bartz, M.J. Alonso Escarza, E. Ben Arous, M. del Val, C. García Rodríguez
Journal title: Radiation Physics and Chemistry
Journal number: 215
Journal publisher: Elsevier BV
Published year: 2024
DOI identifier: 10.1016/J.RADPHYSCHEM.2023.111313
ISSN: 0969-806X