Temperature-dependent electronic transport in reconfigurable transistors based on Ge on SOI and strained SOI platforms

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Authors: Andreas Fuchsberger, Lukas Wind, Daniele Nazzari, Johannes Aberl, Enrique Prado Navarrete, Moritz Brehm, Jean-Michel Hartmann, Frank Fournel, Lilian Vogl, Peter Schweizer, Andrew M. Minor, Masiar Sistani, Walter M. Weber

Journal title: Solid-State Electronics

Journal number: 226

Journal publisher: Elsevier BV

Published year: 2025

DOI identifier: 10.1016/J.SSE.2024.109055

ISSN: 0038-1101