Study of Turn-to-Turn Electrical Breakdown for Superconducting Fault Current Limiter Applications

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Authors: Raphael Chassagnoux, Olivier Lesaint, Nelly Bonifaci, Olivier Gallot-Lavallee, Sebastien Flury, Jean-Luc Palenzuela, Pierre Legendre, Guillaume Escamez, Christophe Creusot, Alain Girodet

Journal title: IEEE Transactions on Applied Superconductivity

Journal number: 29/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 1-5

DOI identifier: 10.1109/tasc.2019.2902117

ISSN: 1051-8223