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Authors: P. Heremans, N. Papadopoulos, A. de Jamblinne de Meux, M. Nag, S. Steudel, M. Rockele, G. Gelinck, A. Tripathi, J. Genoe, K. Myny
Journal title: 2016 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2016
Published pages: 6.3.1-6.3.4
DOI identifier: 10.1109/IEDM.2016.7838360
ISBN: 978-1-5090-3902-9