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Authors: M. Scholz, S. Steudel, K. Myny, S. Chen, R. Boschke, G. Hellings, D. Linten
Journal title: 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
Journal publisher: IEEE
Published year: 2016
Published pages: 1-7
DOI identifier: 10.1109/EOSESD.2016.7592523
ISBN: 978-1-5853-7289-8
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