Portable Low-Cost Measurement Setup for 2D Imaging of Organic Semiconductors

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Authors: Malgorzata Celuch, Olivier Douheret, Przemyslaw Korpas, Ryszard Michnowski, Marzena Olszewska-Placha, Janusz Rudnicki

Journal title: 2020 IEEE/MTT-S International Microwave Symposium (IMS)

Journal publisher: IEEE

Published year: 2020

Published pages: 373-376

DOI identifier: 10.1109/ims30576.2020.9224053

ISBN: 978-1-7281-6815-9