Building a near-field scanning millimeter-wave microscope integrated in a scanning electron microscope

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Authors: Polovodov Petr; Haenssler Olaf; Théron Didier; Boyaval Christophe; Eliet Sophie; Dambrine Gilles; Haddadi Kamel

Journal publisher: IEMN

Published year: 2019

DOI identifier: 10.5281/zenodo.3549373