Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p–n junctions

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Authors: Georg Gramse, Alexander Kölker, Tomáš Škereň, Taylor J. Z. Stock, Gabriel Aeppli, Ferry Kienberger, Andreas Fuhrer, Neil J. Curson

Journal title: Nature Electronics

Journal publisher: Nature Research

Published year: 2020

DOI identifier: 10.1038/s41928-020-0450-8

ISSN: 2520-1131