Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers

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Authors: Olivier Douhéret, Didier Théron, David Moerman

Journal title: Applied Sciences

Journal number: 10/22

Journal publisher: Applied Sciences - MDPI

Published year: 2020

Published pages: 8234

DOI identifier: 10.3390/app10228234

ISSN: 2076-3417