Time-domain Coupled Full Maxwell- and Drift-Diffusion-Solver for Simulating Scanning Microwave Microscopy of Semiconductors

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Authors: A. Gungor, J. Smajic, F. Moro, J. Leuthold

Journal title: 2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring)

Journal publisher: IEEE

Published year: 2019

Published pages: 4071-4077

DOI identifier: 10.1109/piers-spring46901.2019.9017879

ISBN: 978-1-7281-3403-1