Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions

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Authors: P. Polovodov, C. Brillard, O. C. Haenssler, C. Boyaval, D. Deresmes, S. Eliet, F. Wang, N. Clement, D. Theron, G. Dambrine, K. Haddadi

Journal title: 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)

Journal number: NA

Journal publisher: IEEE

Published year: 2018

Published pages: 1-4

DOI identifier: 10.1109/nemo.2018.8503487

ISBN: 978-1-5386-5204-6