Summary
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Authors: F. Eltes, M. Kroh, D. Caimi, C. Mai, Y. Popoff, G. Winzer, D. Petousi, S. Lischke, J. E. Ortmann, L. Czornomaz, L. Zimmermann, J. Fompeyrine, S. Abel
Journal title: 2017 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2017
Published pages: 24.5.1-24.5.4
DOI identifier: 10.1109/iedm.2017.8268454
ISBN: 978-1-5386-3559-9
