The impact of electric stress on charge trap states in SiC-based TrenchMOS.

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Authors: MAREK, Juraj - MATUŠ, Matej - MÁLIK, Viktor - CHVÁLA, Aleš - WEIS, Martin - STUCHLÍKOVÁ, Ľubica.

Journal title: WOCSDICE-EXMATEC 2024 : 47th Workshop on compound semiconductor devices and integrated circuits held in Europe. 18th Expert evaluation and control of compound semiconductor materials and technologies.

Journal publisher: WOCSDICE-EXMATEC

Published year: 2024