Health Monitoring of IGBTs Using Machine Learning Techniques

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Elena Blazhevska, Alexander Otto, Dino Hrvanovic, Guenter Prochart, Matthias K. Scharrer

Journal title: IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society

Journal publisher: IEEE

Published year: 2024

Published pages: 1-7

DOI identifier: 10.1109/iecon51785.2023.10312660