A Variable Gate Resistance SiC MOSFET Driver Network to Mitigate Overshoot and Parasitic Ringing

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Authors: Choo, V. L., & Pfost, M.

Journal title: PCIM Europe 2023; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management

Journal number: 09-11 May 2023

Journal publisher: VDE

Published year: 2023

DOI identifier: 10.30420/566091153

ISBN: 978-3-8007-6091-6