Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations with Applications in Sensitivity Analysis and Yield Prediction

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Elena-Diana Sandru, Emilian David, Ingrid Kovacs, Andi Buzo, Corneliu Burileanu, Georg Pelz

Journal title: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 1-1

DOI identifier: 10.1109/tcad.2021.3054804

ISSN:0278-0070