Online analysis of debug trace data for embedded systems

Summary

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Authors: Normann Decker, Boris Dreyer, Philip Gottschling, Christian Hochberger, Alexander Lange, Martin Leucker, Torben Scheffel, Simon Wegener, Alexander Weiss

Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2018

Published pages: 851-856

DOI identifier: 10.23919/DATE.2018.8342124

ISBN: 978-3-9819263-0-9