Non-Intrusive MC/DC Measurement Based on Traces

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Authors: Faustin Ahishakiye, Svetlana Jaksic, Felix Dino Lange, Malte Schmitz, Volker Stolz, Daniel Thoma

Journal title: 2019 International Symposium on Theoretical Aspects of Software Engineering (TASE)

Journal publisher: IEEE

Published year: 2019

Published pages: 86-92

DOI identifier: 10.1109/tase.2019.00-15

ISBN: 978-1-7281-3342-3