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Authors: P. Galve, C. Soneira-Landin, F. Arias-Valcayo, C. N. Golhen-Mateo, S. Gaitan-Dominguez, V. M. Nouvilas, V. Sanchez-Tembleque, J.L. Herraiz, J.M. Udias
Journal title: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
Journal publisher: IEEE
Published year: 2024
DOI identifier: 10.1109/NSS/MIC/RTSD57108.2024.10656306
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