Understanding the Transistor Behavior of Electron-Spin Qubits Above Cryogenic Temperatures

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Authors: Francesco Lorenzelli, Clement Godfrin, Michele Stucchi, Alexander Grill, Ruoyu Li, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges Gielen

Journal title: IEEE Electron Device Letters

Journal number: 45

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2024

DOI identifier: 10.1109/LED.2024.3463009

ISSN: 1558-0563