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Authors: MIKKO A. UUSITALO; PATRIK RUGELAND; MAURO RENATO BOLDI; EMILIO CALVANESE STRINATI; PANAGIOTIS DEMESTICHAS; MÅRTEN ERICSON; GERHARD P. FETTWEIS; MILTIADIS C. FILIPPOU; AZEDDINE GATI; MARIE-HELENE HAMON; MARCO HOFFMANN; MATTI LATVA-AHO; AARNO PÄRSSINEN; BJÖRN RICHERZHAGEN; HANS SCHOTTEN; TOMMY SVENSSON; GUSTAV WIKSTRÖM; HENK WYMEERSCH; VOLKER ZIEGLER; YANING ZOU
Journal title: IEEE Access
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2021
DOI identifier: 10.1109/ACCESS.2021.3130030
ISSN: 2169-3536
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