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Authors: Merwaday, Arvind; Vannithamby, Rath; Eisen, Mark; Sudhakaran, Susruth; Calvacanti, Dave; Frascolla, Valerio
Journal title: 21st International Conference on Industrial Informatics (INDIN)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.5281/ZENODO.10101504