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Authors: L. F. Deeg, D. Zoepfl, N. Diaz-Naufal, M. L. Juan, A. Metelmann, G. Kirchmair
Journal title: Physical Review Applied
Journal number: 23
Journal publisher: American Physical Society (APS)
Published year: 2025
DOI identifier: 10.1103/PHYSREVAPPLIED.23.014082
ISSN: 2331-7019
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