High-Entropy Analog-Based Strong PUF Reaching 166 F2/Bit Area-to-Entropy-Ratio

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Authors: Alessandro Catania, Sebastiano Strangio, Maksym Paliy, Christian Sbrana, Michele Bertozzi, Giuseppe Iannaccone

Journal title: 2025 IEEE Custom Integrated Circuits Conference (CICC)

Journal publisher: IEEE

Published year: 2025

DOI identifier: 10.1109/CICC63670.2025.10982757