Analytical expression of top surface charge sensitivity in fully depleted semiconductor on insulator MOS transistor

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Authors: G. Ghibaudo, G. Pananakakis

Journal title: Composants nanoélectroniques

Journal number: 2/1

Journal publisher: ISTE

Published year: 2019

DOI identifier: 10.21494/iste.op.2019.0347

ISSN: 2516-3914