Finite element simulation of 2D percolating silicon-nanonet field-effect transistor

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Authors: T. Cazimajou, M. Mouis, G. Ghibaudo

Journal title: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-3

DOI identifier: 10.1109/ulis.2018.8354760

ISBN: 978-1-5386-4811-7