Electrical characteristics of silicon percolating nanonet-based field effect transistors in the presence of dispersion

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Authors: T. Cazimajou, M. Legallais, M. Mouis, C. Ternon, B. Salem, G. Ghibaudo

Journal title: Solid-State Electronics

Journal number: 143

Journal publisher: Pergamon Press Ltd.

Published year: 2018

Published pages: 83-89

DOI identifier: 10.1016/j.sse.2017.11.013

ISSN: 0038-1101