Electrical characterization of percolating silicon nanonet FETs for sensing applications

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Authors: T. Cazimajou, M. Legallais, M. Mouis, C. Ternon, B. Salem, G. Ghibaudo

Journal title: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2017

Published pages: 23-26

DOI identifier: 10.1109/ULIS.2017.7962591

ISBN: 978-1-5090-5313-1