Deep Metric Learning for Sequential Data Using Approximate Information

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Authors: Stefan Thaler, Vlado Menkovski, Milan Petkovic

Journal title: Machine Learning and Data Mining in Pattern Recognition - 14th International Conference, MLDM 2018, New York, NY, USA, July 15-19, 2018, Proceedings, Part I

Journal number: 10934

Journal publisher: Springer International Publishing

Published year: 2018

Published pages: 269-282

DOI identifier: 10.1007/978-3-319-96136-1_22

ISBN: 978-3-319-96135-4