VEDLIoT: Very Efficient Deep Learning in IoT

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Authors: M. Kaiser, R. Griessl, N. Kucza, C. Haumann, L. Tigges, K. Mika, J. Hagemeyer, F. Porrmann, U. Rückert, M. vor dem Berge, S. Krupop, M. Porrmann, M. Tassemeier, P. Trancoso, F. Qararyah, S. Zouzoula, A. Casimiro, A. Bessani, J. Cecílio, S. Andersson, O. Brunnegard, O. Ekiksson, R. Weiss, F. Meierhöfer, H. Salomonsoon, E. Malekzadeh, D. Ödman, A. Khurshid, P. Felber, M. Pasin, V. Schiavoni, J.

Journal title: Automation & Test in Europe Conference & Exhibition (DATE)

Journal number: 14-23 March 2022

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.23919/date54114.2022.9774653

ISSN: 1558-1101