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Authors: Hans-Martin Schwab, Andreas Ihrig, Dominic Depke, Sven Hermann, Michael Schafers, Georg Schmitz
Journal title: 2017 IEEE International Ultrasonics Symposium (IUS)
Journal number: September 2017
Journal publisher: IEEE
Published year: 2017
Published pages: 1-4
DOI identifier: 10.1109/ULTSYM.2017.8092800
ISBN: 978-1-5386-3383-0