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Authors: Wael M. Mohammed, Miroslaw Nejman, Fernando Castano, Jose L. Martinez Lastra, Stanislaw Strzelczak, Alberto Villalonga
Journal title: 2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS)
Journal publisher: IEEE
Published year: 2020
Published pages: 493-498
DOI identifier: 10.1109/icps48405.2020.9274727
ISBN:978-1-7281-6389-5
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