Performance characterization of a prototype dual-layer cone-beam computed tomography system

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Authors: Zavala-Mondragón, L. A., De With, P. H., & Van der Sommen, F. (TU Eindhoven, NL)

Journal title: IEEE Transactions on Image Processing

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

DOI identifier: 10.1109/tip.2021.3125489

ISSN: 1057-7149