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Authors: Jaromir Hrad, Tomas Zeman, Oto Sladek
Journal title: 2018 28th EAEEIE Annual Conference (EAEEIE)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-9
DOI identifier: 10.1109/eaeeie.2018.8534230
ISBN: 978-1-5386-7711-7
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