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Authors: Martin Medvecky, Radoslav Vargic, Juraj Londak, Pavol Podhradsky, Peter Truchly
Journal title: 2018 International Symposium ELMAR
Journal publisher: IEEE
Published year: 2018
Published pages: 15-18
DOI identifier: 10.23919/elmar.2018.8534629
ISBN: 978-953-184-239-6
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