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Authors: Alejandro F. Villaverde, Neil D. Evans, Michael J. Chappell, Julio R. Banga
Journal title: IEEE Control Systems Letters
Journal number: 3/2
Journal publisher: IEEE
Published year: 2019
Published pages: 272-277
DOI identifier: 10.1109/lcsys.2018.2868608
ISSN: 2475-1456
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