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Authors: Michael Jaeger, Tobias Schweizer, Cyril Etter, Patrick Stahli, Martin Frenz
Journal title: 2019 IEEE International Ultrasonics Symposium (IUS)
Journal publisher: IEEE
Published year: 2019
Published pages: 439-442
DOI identifier: 10.1109/ultsym.2019.8925624
ISBN: 978-1-7281-4596-9