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Authors: Aisha Meel-van den Abeelen, Gert Weijers, Jan van Zelst, Johan Thijssen, Ritse Mann, Chris de Korte
Journal title: 2017 IEEE International Ultrasonics Symposium (IUS)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-1
DOI identifier: 10.1109/ultsym.2017.8091781
ISBN: 978-1-5386-3383-0